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Raman microspectroscopic characterization of amorphous silica plastic behavior

Antoine Perriot (SVI) and Valérie Martinez (LPCML) and Laurent Grosvalet (LPCML) and Christine Martinet (LPCML) and Bernard Champagnon (LPCML) and Damien Vandembroucq (SVI) and Etienne Barthel (SVI)

cond-mat.other

Raman microspectroscopy was used to characterize amorphous silica plastic behavior. Using a correlation between Raman spectrum and density, a map of the local residual indentation-induced densification is obtained. The existence of a densification-induced hardening is also evidenced through a diamond anvil cell experiment. Such observations are not accounted for by the previously proposed hardening-free pressure-dependent yield criterion based on indentation curves. These results open the way to more accurate description of a constitutive law for amorphous silica.

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